Abstract: Investigating oxide defect-induced random telegraph noise signals within stress-induced leakage current is a key approach for understanding the degradation of thin oxides in deeply-scaled ...
Abstract: Random Forest (RF) and Long Term Memory Network (LSTM) are used to assess the health status of mobile energy storage devices in this paper. Firstly, the RF model is used to select the ...
More Respondents were asked, "In the long run, do you think the U.S. increasing tariffs will generally help the U.S. economy, hurt the U.S. economy, or have no impact on the U.S. economy?" More ...
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