Abstract: With the gradual increase in high capacity doubly fed induction generators (DFIGs) in recent years, turn-to-turn short-circuit (TTSC) faults have become a greater threat. Notably, owing to ...
Abstract: Fabrication nonuniformity on the wafer causes deviations in the quality of basic devices in superconducting rapid single flux quantum (RSFQ) circuits, which influences the test performance ...
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