Semiconductor Engineering

Semiconductor Metrology: IMMSE For The Rapid ID of Defective Chips (Samsung)

A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” ...
Interesting Engineering on MSN

Scientists develop matrix that works like fingerprint scanner to detect hidden objects

Their approach uses what they call a “fingerprint matrix,” a mathematical description of the unique way each object scatters ...

Finding buried treasures with physics: 'Fingerprint matrix' method uncovers what lies beneath the sand

Can we reveal objects that are hidden in environments completely opaque to the human eye? With conventional imaging ...
IEEE

Efficient and Stable Implementation of RCWA for Ultrathin Multilayer Gratings: T-Matrix Approach Without Solving Eigenvalues

Abstract: Based on the transmittance matrix (T-matrix) approach, an efficient and stable rigorous coupled-wave analysis (RCWA) method for ultrathin multilayer gratings without solving eigenvalues is ...
Scientific Research Publishing

Chu, M. and Lin, W.W. (2009) Quadratic Model Updating with Symmetry, Positive Definiteness, and No Spill-Over. SIAM Journal on Matrix Analysis and Applications, 31, 546-564.

ABSTRACT: In this paper, we consider the model updating problem of the undamped vibroacoustic system with no spill-over (MUP-UVA), which is to update the original system to a new system such that some ...
IEEE

Classification of Covariance Matrix Eigenvalues in Polarimetric SAR for Environmental Monitoring Applications

Abstract: In this paper, we describe novel techniques for automatic classification of the dominant scattering mechanisms associated with the pixels of polarimetric SAR images. Specifically, we ...