Abstract: In this paper, we propose a process-aware analytical gate resistance model for nanosheet field-effect transistors (NSFETs). The proposed NSFET gate resistance is modeled by applying the ...
Background: The evaluation of hospital infection prevention and control (HIPC) courses holds significant importance in guaranteeing the quality. Regrettably, there is currently no specific evaluation ...
Abstract: Process models are frequently used in software engineering to describe business requirements, guide software testing and control system improvement. However, traditional process modeling ...
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