TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced its 7038 Single Test Rack (STR) system-level test (SLT) and ...
Abstract: In the telecommunications field, the problem of data island is caused by the separation and isolation of data. They are distributed in different systems including the business support system ...
Abstract: Aiming at reducing the large distortion of the existing reversible watermarking for three-dimensional(3D) mesh models and meeting the needs of authentication in cloud-based data storage, a ...
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Get precise takeoffs done in a fraction of the time compared to manual methods. PlanSwift’s intuitive digital takeoff tools let you measure quantities quickly, reducing errors and increasing ...
Institut Jean le Rond d’Alembert, CNRS UMR 7190, Sorbonne Université, 2 Place De La Gare De Ceinture, Saint Cyr l’Ecole 78210, France ...
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