Born between 1946 and 1964, baby boomers experienced a world of typewriters, traveler's checks, and duck-and-cover drills.

Abstract: In automatic test pattern generation (ATPG), SAT-based methods are typically used to complement structural approaches, especially for addressing hard-to-detect faults. However, as the size ...

The Xavier School of Management, Jamshedpur, will activate the mock test link for the Xavier Aptitude Test (XAT) 2026 at 5 PM today. Candidates appearing for XAT 2026 can practice with mock tests to ...

In practice, we found that even these 1,000 nits proved enough for the phone to be usable outdoors. The display's anti-reflective surface helps a lot in this regard. That said, the iPhone 17 is far ...

Siemens Digital Industries Software has introduced Tessent AnalogTest software -- an innovative solution that reduces pattern generation time for analog circuit tests from months to days. The solution ...

Siemens Digital Industries Software today introduced Tessent AnalogTest software – an innovative solution that reduces pattern generation time for analogue circuit tests from months to days. The ...

Abstract: To improve test data compression efficiency, the order of the scan unit need be adjusted, which indirectly changes the content of the test pattern. Scan chain partitioning is a common method ...