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From Test Patterns to Streaming: How Baby Boomers Witnessed America Transform

Born between 1946 and 1964, baby boomers experienced a world of typewriters, traveler's checks, and duck-and-cover drills.
IEEE

Transient Fault Detection and Failure Effect Analysis Based on Design for Test and Fault Tree Analysis for Automotive Chips

Abstract: Automotive-grade chips play a crucial role in the development of intelligent networked vehicles, and functional safety is a key issue of automotive-grade chips. Transient faults induced by ...