Abstract: We developed a 55 nm CMOS static random access memory (SRAM) chip that scans all data every 125 ns and outputs timestamped soft error data via an SPI ...
Abstract: This article presents a measurement-based methodology focused on the parasitic extraction of RL elements involved in the commutation power loop of silicon carbide (SiC)-based power modules.
While error correction should become more effective as the number of physical qubits in a logical qubit increases, adding ...
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