POWER Magazine

How EL Testing Is Transforming Solar Panel Damage Assessment

The global solar boom has introduced a new urgency around asset durability, performance, and risk. As utility-scale solar ...
EDN

Unusual 2N3904 transistor circuit

A Planet Analog article, “ 2N3904: Why use a 60-year-old transistor? ” by Bill Schweber, inspired some interest in this old ...
IEEE

Comparative Analysis of SGTMOS Degradation Under Repeated Off-State Avalanche and Short Circuit Current Pulses

Abstract: In this article, a 60-V split-gate trench vertical double diffused metal-oxide-semiconductor field-effect transistor (SGTVDMOS, SGTMOS) with low on-resistance is designed and manufactured.
IEEE

Influences of Arcing Time and Initial Pressure of the Puffer Chamber on Asymmetric Short-Circuit Current Interruption Performance of High-Voltage SF6 Circuit Breakers

Abstract: With the continuous increase in grid capacity and the rise in the time constant of the DC component of short-circuit currents in power systems, the hidden dangers of insufficient ...