Abstract: This paper presents a statistics-based digital background calibration technique for digital-to-analog converter (DAC) unit elements mismatch in pipelined analog-to-digital converters (ADCs).
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Abstract: This paper presents a new calibration method for a Vernier-based time-to-digital converter (TDC). In the proposed method, delay lines in the TDC are configured as on-chip ring oscillators ...
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