BEOL tip-to-tip dielectric reliability characterization using a design-representative test structure
Abstract: This study presents an innovative approach to characterize the reliability of back-end-of-line (BEOL) dielectrics, particularly focusing on the breakdown between metal tips. By using a ...
Abstract: It is important to conduct simulation tests of unmanned vehicles (UV). However, some test scenario generation methods face challenges such as a lack of off-road scenarios and insufficient ...
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