Ruland now offers MI-series single beam couplings, expanding its zero-backlash beam coupling line to include one, four, and ...
Comparison of Gate-Level Techniques for Mitigation of Single Event Transients in Combinational Logic
Abstract: In this paper, the gate-level techniques for mitigation of Single Event Transients (SETs) in combinational circuits have been analyzed. The main objective was to compare the SET mitigation ...
Abstract: To get an advanced high dens device the unit-area-occupation of every single used electronic component must be reduced without increasing the circuit delay, device complexity, and dissipated ...
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