Semiconductor Engineering

Semiconductor Metrology: IMMSE For The Rapid ID of Defective Chips (Samsung)

A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” ...
IEEE

Robust Time-Domain-Based Spectral Processing Method for Laser Self-Mixing Vibration Measurement

Abstract: Robust and contactless sensing schemes have always been enormous challenges in mechanical vibration measurement and need to be solved urgently. A novel vibration measurement technique based ...
C&EN

Spatial Proteomics toward Subcellular Resolution by Coupling Deep Ultraviolet Laser Ablation with Nanodroplet Sample Preparation

Creative Commons (CC): This is a Creative Commons license. Attribution (BY): Credit must be given to the creator. Article Views are the COUNTER-compliant sum of full text article downloads since ...
C&EN

Sensing Liquid- and Gas-Phase Hydrocarbons via Mid-Infrared Broadband Femtosecond Laser Source Spectroscopy

Creative Commons (CC): This is a Creative Commons license. Attribution (BY): Credit must be given to the creator. Article Views are the COUNTER-compliant sum of full text article downloads since ...