Abstract: Finding and replacing the defective insulated-gate bipolar transistor (IGBT) module timely by monitoring the ageing state of IGBT can improve the reliability of a power converter and reduce ...
Abstract: Thermoelectric (TE) devices have shown promise for on-demand cooling of ICs. However, the additional energy required for cooling remains a challenge for the successful deployment of these ...
This project demonstrates the **design of a 6-Transistor (6T) SRAM memory cell** using the **Electric VLSI Design System**. It includes only the **schematic and layout**—simulation and waveform ...
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