Electronic Design

Test Setup Checks Transistors’ hFEs When Tight Control Is Important

This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
Electronic Design

System-level test contends with billions of untested transistors

Why might you need semiconductor system-level test (SLT)? As Karthik Ranganathan, director for semiconductor solutions at Astronics Test Systems, points out, if you test a 22-nm, ...
EDN

1st successful test of the transistor, December 16, 1947

What began as research to improve telephone service became one of the most important inventions in electronics history. In 1945, AT&T’s research division, Bell Labs, began working on technology to ...
EDN

Coating lets nanotube transistors self-assemble on chips

Portland, Ore. — Next-generation semiconductors aim to harness the ballistic electron transport capabilities of pure carbon nanotubes, but until now there has been no easy way to integrate the tubes ...