Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...
The Scanning Tunneling Microscopy (STM) was the first technique; in fact, it was invented in 1981 by Gerd Binnig and Heinrich Rohrer at IBM Zurich and after five years they won Nobel Prize in physics.
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents ...
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