This article is dedicated to Jim Williams who several years ago (2006) wrote an article in EDN regarding the need of a good lab apparatus to qualify the behavior of voltage regulators for compliance ...

You use an active-load test circuit to ensure that a power supply for a microprocessor or for other digital loads supplies 100A transient currents. This active load can provide a dc load for a power ...

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...

As test targets shrink, the benefits of socketless probing technology grow. As technology advances, more and more electronic components that do bigger and better things are hitting the market. At the ...

Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...