A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Intel this week revealed defect density metrics for its 18A (1.8nm-class) process technology and said that it was healthy at the Deutsche Bank's 2024 Technology Conference. The company also said that ...

(Editor's Note: This is the first of a series of articles that will define what is predicted yield improvement and how it can be measured or validated using test data) Design for Yield (DFY) tools are ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. This article dives into the happens-before ...